SMAGIC.

Semiconductor AOI Inspection Platforms

Multi-Function SQ7000+ for 3D AOI, SPI and CMM

Multi-Function SQ7000+ for 3D AOI, SPI and CMM

SQ7000+ The multi-function system uses Multi-Reflection Suppression® (MRS®) sensor technology with high resolution, high accuracy and high-speed inspection and metrology — the only system on the market that performs AOI, SPI and CMM inline.

Precision Grade

Normal Grade N
High Grade H
Precision Grade P
Super Precision SP
Ultra Precision UP

Inspection Speed16 cm²/sec (2D+3D)
PCB Size

Min: 50 x 50 mm (2 x 2 in.);

Max: 420 x 320 mm (16.5 x 12.5 in.)

Resolution XY / Z


5 µm / 0.1 µm

Max Weight (PCB or sample)10 kg
Component Types InspectedStandard SMT (chips, J-leads, gull-wing, BGA, etc.), through-hole, odd-form, clips, connectors, pin-headers
etc.
Solder joints and other defectsGold-finger contamination, excess solder, insufficient solder, bridging, through-hole pins

Minimum Component Size0201 mm (008004 in.)
Allowable Product HeightTop: 20 mm; bottom: 50 mm
Field of View (FOV)


25 x 25 mm

Min/Max measured height:Min 10 um; max 400 um (spec), 2.4 mm (performance)
Component DefectsMissing, polarity, tombstoning, skewing, flipping, wrong parts, oversized, damaged leads, etc.
Coordinate Measurement
Capability
Linear / distance / X,Y / midlines, intersection points / best-fit shifts, datum X,Y / LSF X,Y offset,
X,Y Offset / value / position / X,Y value lists, height / local height / best-fit / radius, coplanarity / distance-to-plane / second-order fit, deviation / absolute / √2 / Cpk, max / min / average / sigma / add / subtract / multiply
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